<?xml version="1.0"?>
<records>
  <record>
    <language>eng</language>
    <publisher>Ansari Education and Research Society</publisher>
    <journalTitle>Journal of Ultra Scientist of Physical Sciences</journalTitle>
    <issn/>
    <eissn/>
    <publicationDate>April 2010</publicationDate>
    <volume>22</volume>
    <issue>1</issue>
    <startPage>127</startPage>
    <endPage>132</endPage>
    <doi>jusps-A</doi>
    <publisherRecordId>1036</publisherRecordId>
    <documentType>article</documentType>
    <title language="eng">Double Sampling Plan Under Inspection Error</title>
    <authors>
      <author>
        <name>J.R. Singh (jrsinghstat@gmail.com)</name>
        <affiliationId>1</affiliationId>
      </author>
      <author>
        <name>N. Singh (nivedita.singh4@gmail.com)</name>
        <affiliationId>1</affiliationId>
      </author>
    </authors>
    <affiliationsList>
      <affiliationName affiliationId="1">School of Studied in Statics Vikarma Universtiy, Ujjain (M.P.) INDIA</affiliationName>
    </affiliationsList>
    <abstract language="eng">&lt;p style="text-align: justify;"&gt;The effects of inspection errors on acceptance sampling when one is inspecting for the number of nonconformities per item is considered , two types of inspections are defined. Formulas are derived for the OC and ASN for situations when these inspection error are present for double sampling plan . An example illustrates the effects of these inspection errors on both the OC and ASN curves.&lt;br /&gt;&#xD;
&amp;nbsp;&lt;/p&gt;&#xD;
</abstract>
    <fullTextUrl format="html">https://www.ultrascientist.org/paper/1036/</fullTextUrl>
    <keywords>
      <keyword language="eng">Inspection error</keyword>
    </keywords>
    <keywords>
      <keyword language="eng">Double sampling plan</keyword>
    </keywords>
    <keywords>
      <keyword language="eng">Poisson process</keyword>
    </keywords>
    <keywords>
      <keyword language="eng">OC and ASN function</keyword>
    </keywords>
  </record>
</records>
